VSD-E/XE quality control procedure

Every sold VSD-E with panelVSD-E & VSD-XE has gone throught the following testing sequence where devices are taken to their specified maximum limits and beyond:

  1. DSP chip flash memory verification (+drive performs this on every power-up)
  2. Testing of every I/O line including
    1. Encoder & Hall sensor inputs
    2. Input noise filtering test
    3. EXT connector outputs
    4. CMD connector I/O's
    5. SPI connector
  3. 100% burn-in testing consisting
    1. Continuous output test at 2×21A current
    2. Temperature range testing from 25⁰C to 75⁰C at full power
    3. Power effeciency testing
    4. Input voltage testig from 12 to 165 VDC
    5. Current sensing & voltage sensing circuits testing
  4. Serial numbering and individual drive test data storage to database